WO2005013016A3 - Method and system for real time diagnosis of machine operation - Google Patents

Method and system for real time diagnosis of machine operation Download PDF

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Publication number
WO2005013016A3
WO2005013016A3 PCT/IL2004/000712 IL2004000712W WO2005013016A3 WO 2005013016 A3 WO2005013016 A3 WO 2005013016A3 IL 2004000712 W IL2004000712 W IL 2004000712W WO 2005013016 A3 WO2005013016 A3 WO 2005013016A3
Authority
WO
WIPO (PCT)
Prior art keywords
real time
machine
time diagnosis
diagnosis
explanations
Prior art date
Application number
PCT/IL2004/000712
Other languages
French (fr)
Other versions
WO2005013016A2 (en
Inventor
Arie Melul
Alon Lavi
Original Assignee
Arie Melul
Alon Lavi
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Arie Melul, Alon Lavi filed Critical Arie Melul
Publication of WO2005013016A2 publication Critical patent/WO2005013016A2/en
Publication of WO2005013016A3 publication Critical patent/WO2005013016A3/en

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Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0232Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on qualitative trend analysis, e.g. system evolution
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G05B23/0245Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a qualitative model, e.g. rule based; if-then decisions
    • G05B23/0251Abstraction hierarchy, e.g. "complex systems", i.e. system is divided in subsystems, subsystems are monitored and results are combined to decide on status of whole system
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0267Fault communication, e.g. human machine interface [HMI]

Abstract

The proposed system according to the present invention provides a real time diagnosis of machine failures during operation, wherein said diagnosis is based on in-depth Statistical Process Control (SPC, 13) data of all machine assembly units at all structure levels. The system defines the malfunctioning machine's units (14), while presenting the failure type and recommended correction actions (19) that should be taken in order to repair the failure. Moreover, the system provides explanations of the system's logic that lead to its conclusions. These explanations are presented to a user in natural language that is easy to work with and understand by human operators.
PCT/IL2004/000712 2003-08-05 2004-08-03 Method and system for real time diagnosis of machine operation WO2005013016A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US49230903P 2003-08-05 2003-08-05
US60/492,309 2003-08-05

Publications (2)

Publication Number Publication Date
WO2005013016A2 WO2005013016A2 (en) 2005-02-10
WO2005013016A3 true WO2005013016A3 (en) 2005-07-14

Family

ID=34115615

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IL2004/000712 WO2005013016A2 (en) 2003-08-05 2004-08-03 Method and system for real time diagnosis of machine operation

Country Status (1)

Country Link
WO (1) WO2005013016A2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4442550B2 (en) * 2005-11-15 2010-03-31 オムロン株式会社 Defect analysis location identification device, failure analysis location identification method, failure analysis location identification program, and computer-readable recording medium
US10409926B2 (en) * 2013-11-27 2019-09-10 Falkonry Inc. Learning expected operational behavior of machines from generic definitions and past behavior
US10037128B2 (en) 2014-02-04 2018-07-31 Falkonry, Inc. Operating behavior classification interface
TWI760975B (en) * 2020-12-17 2022-04-11 凌華科技股份有限公司 SMT machine throwing analysis and abnormal notification system and method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5862054A (en) * 1997-02-20 1999-01-19 Taiwan Semiconductor Manufacturing Company, Ltd. Process monitoring system for real time statistical process control
US5943237A (en) * 1996-10-21 1999-08-24 U.S. Philips Corporation Method and system for assessing a measurement procedure and measurement-induced uncertainties on a batchwise manufacturing process of discrete products
US6725402B1 (en) * 2000-07-31 2004-04-20 Advanced Micro Devices, Inc. Method and apparatus for fault detection of a processing tool and control thereof using an advanced process control (APC) framework

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5943237A (en) * 1996-10-21 1999-08-24 U.S. Philips Corporation Method and system for assessing a measurement procedure and measurement-induced uncertainties on a batchwise manufacturing process of discrete products
US5862054A (en) * 1997-02-20 1999-01-19 Taiwan Semiconductor Manufacturing Company, Ltd. Process monitoring system for real time statistical process control
US6725402B1 (en) * 2000-07-31 2004-04-20 Advanced Micro Devices, Inc. Method and apparatus for fault detection of a processing tool and control thereof using an advanced process control (APC) framework

Also Published As

Publication number Publication date
WO2005013016A2 (en) 2005-02-10

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