WO2005013016A3 - Method and system for real time diagnosis of machine operation - Google Patents
Method and system for real time diagnosis of machine operation Download PDFInfo
- Publication number
- WO2005013016A3 WO2005013016A3 PCT/IL2004/000712 IL2004000712W WO2005013016A3 WO 2005013016 A3 WO2005013016 A3 WO 2005013016A3 IL 2004000712 W IL2004000712 W IL 2004000712W WO 2005013016 A3 WO2005013016 A3 WO 2005013016A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- real time
- machine
- time diagnosis
- diagnosis
- explanations
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
- G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
- G05B23/0232—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on qualitative trend analysis, e.g. system evolution
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
- G05B23/0245—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a qualitative model, e.g. rule based; if-then decisions
- G05B23/0251—Abstraction hierarchy, e.g. "complex systems", i.e. system is divided in subsystems, subsystems are monitored and results are combined to decide on status of whole system
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
- G05B23/0267—Fault communication, e.g. human machine interface [HMI]
Abstract
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US49230903P | 2003-08-05 | 2003-08-05 | |
US60/492,309 | 2003-08-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2005013016A2 WO2005013016A2 (en) | 2005-02-10 |
WO2005013016A3 true WO2005013016A3 (en) | 2005-07-14 |
Family
ID=34115615
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/IL2004/000712 WO2005013016A2 (en) | 2003-08-05 | 2004-08-03 | Method and system for real time diagnosis of machine operation |
Country Status (1)
Country | Link |
---|---|
WO (1) | WO2005013016A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4442550B2 (en) * | 2005-11-15 | 2010-03-31 | オムロン株式会社 | Defect analysis location identification device, failure analysis location identification method, failure analysis location identification program, and computer-readable recording medium |
US10409926B2 (en) * | 2013-11-27 | 2019-09-10 | Falkonry Inc. | Learning expected operational behavior of machines from generic definitions and past behavior |
US10037128B2 (en) | 2014-02-04 | 2018-07-31 | Falkonry, Inc. | Operating behavior classification interface |
TWI760975B (en) * | 2020-12-17 | 2022-04-11 | 凌華科技股份有限公司 | SMT machine throwing analysis and abnormal notification system and method |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5862054A (en) * | 1997-02-20 | 1999-01-19 | Taiwan Semiconductor Manufacturing Company, Ltd. | Process monitoring system for real time statistical process control |
US5943237A (en) * | 1996-10-21 | 1999-08-24 | U.S. Philips Corporation | Method and system for assessing a measurement procedure and measurement-induced uncertainties on a batchwise manufacturing process of discrete products |
US6725402B1 (en) * | 2000-07-31 | 2004-04-20 | Advanced Micro Devices, Inc. | Method and apparatus for fault detection of a processing tool and control thereof using an advanced process control (APC) framework |
-
2004
- 2004-08-03 WO PCT/IL2004/000712 patent/WO2005013016A2/en active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5943237A (en) * | 1996-10-21 | 1999-08-24 | U.S. Philips Corporation | Method and system for assessing a measurement procedure and measurement-induced uncertainties on a batchwise manufacturing process of discrete products |
US5862054A (en) * | 1997-02-20 | 1999-01-19 | Taiwan Semiconductor Manufacturing Company, Ltd. | Process monitoring system for real time statistical process control |
US6725402B1 (en) * | 2000-07-31 | 2004-04-20 | Advanced Micro Devices, Inc. | Method and apparatus for fault detection of a processing tool and control thereof using an advanced process control (APC) framework |
Also Published As
Publication number | Publication date |
---|---|
WO2005013016A2 (en) | 2005-02-10 |
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