EP0865607A4 - Double sided optical disc surface inspector - Google Patents

Double sided optical disc surface inspector

Info

Publication number
EP0865607A4
EP0865607A4 EP97941166A EP97941166A EP0865607A4 EP 0865607 A4 EP0865607 A4 EP 0865607A4 EP 97941166 A EP97941166 A EP 97941166A EP 97941166 A EP97941166 A EP 97941166A EP 0865607 A4 EP0865607 A4 EP 0865607A4
Authority
EP
European Patent Office
Prior art keywords
optical disc
double sided
disc surface
sided optical
surface inspector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP97941166A
Other languages
German (de)
French (fr)
Other versions
EP0865607A1 (en
Inventor
John M Suhan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wea Manufacturing Inc
Original Assignee
Wea Manufacturing Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wea Manufacturing Inc filed Critical Wea Manufacturing Inc
Publication of EP0865607A1 publication Critical patent/EP0865607A1/en
Publication of EP0865607A4 publication Critical patent/EP0865607A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9506—Optical discs
EP97941166A 1996-09-05 1997-09-05 Double sided optical disc surface inspector Withdrawn EP0865607A4 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US70860896A 1996-09-05 1996-09-05
US708608 1996-09-05
PCT/IB1997/001231 WO1998010271A1 (en) 1996-09-05 1997-09-05 Double sided optical disc surface inspector

Publications (2)

Publication Number Publication Date
EP0865607A1 EP0865607A1 (en) 1998-09-23
EP0865607A4 true EP0865607A4 (en) 1999-12-01

Family

ID=24846479

Family Applications (1)

Application Number Title Priority Date Filing Date
EP97941166A Withdrawn EP0865607A4 (en) 1996-09-05 1997-09-05 Double sided optical disc surface inspector

Country Status (4)

Country Link
EP (1) EP0865607A4 (en)
JP (1) JPH11515108A (en)
AU (1) AU735879B2 (en)
WO (1) WO1998010271A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3261362B2 (en) * 1998-05-28 2002-02-25 株式会社アドバンテスト Surface condition measuring method and device
DE19929118C2 (en) * 1999-06-25 2001-05-10 Basler Ag Method for the optical inspection of the intermediate layer of an at least three-layer flat object
DE102004058126A1 (en) * 2004-12-02 2006-06-08 Leica Microsystems Jena Gmbh Device for inspecting the front and back of a disc-shaped object
AU2006240965A1 (en) 2005-04-21 2006-11-02 Sumitomo Electric Industries, Ltd. Superconducting wire inspection device and inspection method
DE602006002877D1 (en) * 2006-04-24 2008-11-06 Siemens Ag Method for detecting metal particles
JP5198189B2 (en) * 2008-08-29 2013-05-15 富士フイルム株式会社 Hard disk inspection device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4954723A (en) * 1988-06-13 1990-09-04 Fuji Photo Film Co., Ltd. Disk surface inspection method and apparatus therefor
US5381225A (en) * 1991-02-28 1995-01-10 Canon Kabushiki Kaisha Surface-condition inspection apparatus
JPH0743311A (en) * 1993-07-29 1995-02-14 Canon Inc Surface inspection device and aligner with the device
JPH07140089A (en) * 1993-11-16 1995-06-02 Hitachi Electron Eng Co Ltd Device for detecting scratch flaw on magnetic disc
US5581348A (en) * 1993-07-29 1996-12-03 Canon Kabushiki Kaisha Surface inspecting device using bisected multi-mode laser beam and system having the same

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2559581B1 (en) * 1984-02-10 1986-07-11 Siderurgie Fse Inst Rech METHOD AND INSTALLATION FOR DETECTING SURFACE DEFECTS ON A TAPE DURING TRIPPING
JPS62173731A (en) * 1986-01-28 1987-07-30 Toshiba Corp Inspection device for surface of article to be inspected

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4954723A (en) * 1988-06-13 1990-09-04 Fuji Photo Film Co., Ltd. Disk surface inspection method and apparatus therefor
US5381225A (en) * 1991-02-28 1995-01-10 Canon Kabushiki Kaisha Surface-condition inspection apparatus
JPH0743311A (en) * 1993-07-29 1995-02-14 Canon Inc Surface inspection device and aligner with the device
US5581348A (en) * 1993-07-29 1996-12-03 Canon Kabushiki Kaisha Surface inspecting device using bisected multi-mode laser beam and system having the same
JPH07140089A (en) * 1993-11-16 1995-06-02 Hitachi Electron Eng Co Ltd Device for detecting scratch flaw on magnetic disc

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO9810271A1 *

Also Published As

Publication number Publication date
JPH11515108A (en) 1999-12-21
EP0865607A1 (en) 1998-09-23
AU735879B2 (en) 2001-07-19
WO1998010271A1 (en) 1998-03-12
AU4316797A (en) 1998-03-26

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