DE602008004353D1 - Reich - Google Patents
ReichInfo
- Publication number
- DE602008004353D1 DE602008004353D1 DE602008004353T DE602008004353T DE602008004353D1 DE 602008004353 D1 DE602008004353 D1 DE 602008004353D1 DE 602008004353 T DE602008004353 T DE 602008004353T DE 602008004353 T DE602008004353 T DE 602008004353T DE 602008004353 D1 DE602008004353 D1 DE 602008004353D1
- Authority
- DE
- Germany
- Prior art keywords
- capacitors
- capacitor
- floating
- reference voltage
- coupled
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000003990 capacitor Substances 0.000 abstract 14
- 238000000034 method Methods 0.000 abstract 2
- 238000005070 sampling Methods 0.000 abstract 2
- 238000006243 chemical reaction Methods 0.000 abstract 1
- 230000008878 coupling Effects 0.000 abstract 1
- 238000010168 coupling process Methods 0.000 abstract 1
- 238000005859 coupling reaction Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
- H03M1/129—Means for adapting the input signal to the range the converter can handle, e.g. limiting, pre-scaling ; Out-of-range indication
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
- H03M1/0678—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components
- H03M1/068—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components the original and additional components or elements being complementary to each other, e.g. CMOS
- H03M1/0682—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components the original and additional components or elements being complementary to each other, e.g. CMOS using a differential network structure, i.e. symmetrical with respect to ground
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
- H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
- H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102007033689A DE102007033689B4 (de) | 2007-07-19 | 2007-07-19 | Analog-Digital-Wandler mit sukzessivem Approximationsregister und großem Eingangsbereich |
US1674007P | 2007-12-26 | 2007-12-26 | |
US12/173,283 US7773024B2 (en) | 2007-07-19 | 2008-07-15 | SAR analog-to-digital converter with large input range |
PCT/EP2008/059446 WO2009010581A1 (en) | 2007-07-19 | 2008-07-18 | Sar analog-to-digital converter with large input range |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602008004353D1 true DE602008004353D1 (de) | 2011-02-17 |
Family
ID=40091980
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102007033689A Expired - Fee Related DE102007033689B4 (de) | 2007-07-19 | 2007-07-19 | Analog-Digital-Wandler mit sukzessivem Approximationsregister und großem Eingangsbereich |
DE602008004353T Active DE602008004353D1 (de) | 2007-07-19 | 2008-07-18 | Reich |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE102007033689A Expired - Fee Related DE102007033689B4 (de) | 2007-07-19 | 2007-07-19 | Analog-Digital-Wandler mit sukzessivem Approximationsregister und großem Eingangsbereich |
Country Status (5)
Country | Link |
---|---|
US (1) | US7773024B2 (de) |
EP (1) | EP2171853B1 (de) |
AT (1) | ATE494662T1 (de) |
DE (2) | DE102007033689B4 (de) |
WO (1) | WO2009010581A1 (de) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102008035215B4 (de) | 2008-07-29 | 2010-09-09 | Texas Instruments Deutschland Gmbh | Elektronisches Bauelement und Verfahren zur Analog-Digital-Wandlung unter Verwendung von sukzessiver Approximation |
DE102009004564B4 (de) * | 2009-01-14 | 2013-08-22 | Texas Instruments Deutschland Gmbh | ADC mit energiesparender Abtastung |
US8378864B2 (en) * | 2011-03-16 | 2013-02-19 | Integrated Device Technology, Inc. | Apparatuses and methods for reducing errors in analog to digital converters |
US8395538B2 (en) | 2011-06-20 | 2013-03-12 | Texas Instruments Incorporated | High speed resistor-DAC for SAR DAC |
US20130002468A1 (en) * | 2011-06-28 | 2013-01-03 | International Business Machines Corporation | Analog-digital converter |
US8633847B2 (en) * | 2011-06-28 | 2014-01-21 | International Business Machines Corporation | Analog-digital converter |
US9154152B1 (en) * | 2014-03-14 | 2015-10-06 | Mediatek Inc. | Calibration and noise reduction of analog to digital converters |
JP6287433B2 (ja) * | 2014-03-25 | 2018-03-07 | セイコーエプソン株式会社 | 逐次比較型アナログ−デジタル変換器、物理量検出センサー、電子機器及び移動体並びに逐次比較型アナログ−デジタル変換方法 |
CN106603077B (zh) * | 2016-11-22 | 2019-11-05 | 电子科技大学 | 一种逐次逼近全差分模数转换器及其工作流程 |
WO2018176326A1 (zh) * | 2017-03-30 | 2018-10-04 | 深圳市汇顶科技股份有限公司 | 模数转换电路和方法 |
JP7288645B2 (ja) * | 2018-04-16 | 2023-06-08 | ザインエレクトロニクス株式会社 | Ad変換器 |
TWI650952B (zh) * | 2018-08-28 | 2019-02-11 | 新唐科技股份有限公司 | 連續漸近式類比數位轉換器 |
TWI672006B (zh) * | 2018-09-28 | 2019-09-11 | 新唐科技股份有限公司 | 連續漸近式類比數位轉換器及控制方法 |
US11031946B1 (en) * | 2020-02-19 | 2021-06-08 | Dialog Semiconductor | Apparatus and method for low-latency low-power analog-to-digital conversion with high input signals |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6720903B2 (en) * | 2002-06-14 | 2004-04-13 | Stmicroelectronics S.R.L. | Method of operating SAR-type ADC and an ADC using the method |
US7167121B2 (en) * | 2002-10-16 | 2007-01-23 | Analog Devices, Inc. | Method and apparatus for split reference sampling |
US6940445B2 (en) * | 2002-12-27 | 2005-09-06 | Analog Devices, Inc. | Programmable input range ADC |
JP3902778B2 (ja) * | 2004-01-07 | 2007-04-11 | 株式会社半導体理工学研究センター | アナログディジタル変換回路 |
US7023372B1 (en) * | 2005-02-09 | 2006-04-04 | Analog Devices, Inc. | Method and apparatus for segmented, switched analog/digital converter |
US7271758B2 (en) * | 2005-06-29 | 2007-09-18 | Silicon Laboratories Inc. | Gain adjust for SAR ADC |
JP4751667B2 (ja) | 2005-08-12 | 2011-08-17 | 富士通セミコンダクター株式会社 | 逐次比較型ad変換器。 |
JP4652214B2 (ja) * | 2005-11-18 | 2011-03-16 | 富士通セミコンダクター株式会社 | アナログデジタル変換器 |
US7746262B2 (en) * | 2005-12-19 | 2010-06-29 | Silicon Laboratories Inc. | Coding method for digital to analog converter of a SAR analog to digital converter |
-
2007
- 2007-07-19 DE DE102007033689A patent/DE102007033689B4/de not_active Expired - Fee Related
-
2008
- 2008-07-15 US US12/173,283 patent/US7773024B2/en active Active
- 2008-07-18 WO PCT/EP2008/059446 patent/WO2009010581A1/en active Application Filing
- 2008-07-18 EP EP08775221A patent/EP2171853B1/de active Active
- 2008-07-18 AT AT08775221T patent/ATE494662T1/de not_active IP Right Cessation
- 2008-07-18 DE DE602008004353T patent/DE602008004353D1/de active Active
Also Published As
Publication number | Publication date |
---|---|
EP2171853B1 (de) | 2011-01-05 |
DE102007033689B4 (de) | 2009-03-19 |
EP2171853A1 (de) | 2010-04-07 |
DE102007033689A1 (de) | 2009-01-22 |
ATE494662T1 (de) | 2011-01-15 |
US7773024B2 (en) | 2010-08-10 |
US20090027251A1 (en) | 2009-01-29 |
WO2009010581A1 (en) | 2009-01-22 |
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