CN205621076U - 具有多路径干扰减轻的尺寸标注系统 - Google Patents

具有多路径干扰减轻的尺寸标注系统 Download PDF

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CN205621076U
CN205621076U CN201520810685.6U CN201520810685U CN205621076U CN 205621076 U CN205621076 U CN 205621076U CN 201520810685 U CN201520810685 U CN 201520810685U CN 205621076 U CN205621076 U CN 205621076U
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S.蒂里斯
A.吉莱
F.拉法格
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Hand Held Products Inc
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2408Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring roundness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518Projection by scanning of the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/255Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring radius of curvature

Abstract

本实用新型涉及具有多路径干扰减轻的尺寸标注系统。公开了一种用于使用渡越时间尺寸标注系统测量物品的尺寸的系统和方法。该系统和方法减轻多路径失真并且改善特别是在移动环境中的测量的精度。为了减轻多路径失真,成像器捕获感兴趣的物品的图像。该图像被处理为确定对应于感兴趣的物品的大小、形状和位置的照明区域。使用该信息来控制可调整孔径的大小、形状和位置,所以在渡越时间分析中使用的光束基本上照射照明区域而没有首先被反射。

Description

具有多路径干扰减轻的尺寸标注系统
技术领域
本发明涉及尺寸标注系统,更具体地涉及具有减少的多路径干扰的渡越时间光学尺寸标注系统。
背景技术
一般而言,物体的物理大小(即,物体的尺寸)可以被自动测量并且不与尺寸标注系统接触。这些尺寸标注系统通常依赖于测距传感器来确定物品上的点的范围。然后,该物品的大小可以通过比较该物品上的各个点的范围来进行计算。测距传感器可以使用超声、射频(RF)或光信号来检测范围。一种这样光学测距传感器采用渡越时间(TOF)测量来测量范围。
渡越时间(TOF)传感器提供了优于其他光学测距传感器(例如,结构光或立体视觉)的优点。TOF传感器的一个优点是其简单性。存在没有移动部件,并且因为感测范围不需要特殊的几何形状,所以可以使整个系统紧凑。而且,与其他传感器相比,范围的感测和计算是相对直接,并且需要少量处理能力。这意味着降低的功率要求,并且可能导致更快的尺寸标注结果。这些优点使得TOF尺寸标注系统更适合于非固定(即,移动或手持式)尺寸标注应用。
然而,TOF尺寸标注系统不是没有其局限性的。例如,TOF传感器通过首先用光束照射场景(即,视场)来感测感兴趣的物品的范围。如果视场比感兴趣的物品大,则光束可以沿若干不同路径到达感兴趣的物品。例如,一些路径在到达感兴趣的物品之前可能经历一次或多次反射。这被称为多路径并且导致范围测量的失真,其进而导致尺寸标注错误。来自反射路径的光可以表明,到感兴趣的物品的距离(即,范围)为大于实际物理距离。一些控制多路径失真的手段是必要的。
控制感兴趣的物品被测量的环境是一种方法。这里,来自背景的反射可以被最小化,并且可以仔细控制物品的放置。另外,物品的尺寸和形状可以被约束。虽然这些措施可能适用于固定安装,但是对于多数移动尺寸标注应用(例如,包裹递送和收集)将不实际。在这些应用中,不可能控制环境(例如,仓库)和感兴趣的物品(例如,包裹)。
存在对一种适合于移动环境的尺寸标注系统的一般需要。渡越时间(TOF)尺寸标注系统是合适的,但是可能遭受多路径失真。因此,存在对一种TOF尺寸标注系统的具体需要,该TOF尺寸标注系统具有自适应多路径干扰抑制,以促进各种环境中的各种物品的精确尺寸标注。
发明内容
因此,在一个方面中,本发明包括渡越时间(TOF)尺寸标注系统。TOF尺寸标注系统包括照明子系统,其被配置为生成并且朝着感兴趣的物品沿着光轴投射光束。光束在横向于光轴的平面中的空间幅度被可调整孔径限制。TOF尺寸标注系统进一步包括成像器,其被定位和配置为捕获感兴趣的物品的图像。该系统还包括TOF传感器,其被定位和配置为从感兴趣的物品反射的光束捕获范围图像。控制子系统进一步被包括作为TOF尺寸标注系统的一部分。该控制子系统通信地耦合到可调整孔径、成像器和TOF传感器,并且被配置为(i)从捕获的图像确定与感兴趣的物品相对应的照明区域,(ii)将可调整孔径的大小、形状和/或位置配置为符合照明区域,并且(iii)确定感兴趣的物品的至少近似尺寸测量。
在示例性实施例中,渡越时间(TOF)尺寸标注系统的光束基本上照射照明区域并且基本上到达感兴趣的物品而没有首先被反射。
在另一示例性实施例中,渡越时间(TOF)尺寸标注系统的尺寸测量是体积。
在另一方面中,本发明包括渡越时间(TOF)尺寸标注系统。TOF尺寸标注系统包括用于生成光的光源。TOF尺寸标注系统还包括位于光源前方的光学子组件。光学子组件被配置为朝着感兴趣的物品沿着光轴投射光束。可调整孔径被包括在照明子系统中,并且沿着光轴被定位在光学子组件和感兴趣的物品之间。可调整孔径包括用于阻挡光束的至少一部分的阻挡区域。阻挡区域的大小、形状和位置是可控制的。TOF尺寸标注系统包括成像器,其被定位和配置用于捕获感兴趣的物品的图像。通信地耦合到可调整孔径和成像器的控制子系统还包括在TOF尺寸标注系统中。控制子系统被配置为从所捕获的图像确定与感兴趣的物品的大小、形状和位置相对应的照明区域。该控制子系统进一步被配置为控制可调整孔径的阻挡区域,使得来自光源的光基本上照射照明区域并且基本上到达感兴趣的物品而没有首先被反射。
在示例性实施例中,TOF尺寸标注系统的光源是激光器。
在另一示例性实施例中,TOF尺寸标注系统的光学子组件包括衍射光学元件(DOE)。
在另一示例性实施例中,TOF尺寸标注系统的可调整孔径包括液晶显示器(LCD)屏幕。
在又一方面中,本发明包括一种用于减少在渡越时间(TOF)尺寸标注系统中的多路径失真的方法。该方法包括下述步骤:捕获感兴趣的物品的图像,并且从该图像确定与感兴趣的物品相对应的照明区域。该方法还包括下述步骤:调整可调整孔径。可调整孔径位于光源前方,所以指向感兴趣的物品的光束基本上照射照明区域并且基本上到达感兴趣的物品而没有首先被反射。
前述说明性摘要以及本发明的其他示例性目的和/或优点和实现其的方式在以下具体描述及其附图内被进一步解释。
附图说明
图1图解地描绘了具有多路径照明的示例性渡越时间尺寸标注系统。
图2图解地描绘了不具有多路径照明的示例性渡越时间尺寸标注系统。
图3a图解地描绘了孔径调整之前的示例性渡越时间尺寸标注系统。
图3b图解地描绘了孔径调整之后的示例性渡越时间尺寸标注系统。
图4示意性描绘了示例性渡越时间尺寸标注系统的框图。
图5示意性描绘了用于图示渡越时间尺寸标注的示例性方法的流程图,该方法包括用于减少多路径失真的步骤。
具体实施方式
本发明包括用于从渡越时间(TOF)尺寸标注系统中减轻多路径失真的系统和方法。TOF尺寸标注系统用于线性或体积尺寸的测量。TOF尺寸标注系统通过测量脉冲光束行进一定距离(例如,从TOF尺寸标注系统到物体并且然后返回到TOF尺寸标注系统的路径的距离)所花费的时间而获得视场内的点的相对位置。
TOF尺寸标注系统1可以使用照明子系统40来朝着感兴趣的物品2(例如,包裹)沿着光轴5投射一束光3(即,光束)。光束3可以是可见的或不可见的,并且通常被幅度调制,从而形成了一个或多个脉冲。脉冲光束照射场景,并且被物体反射回到尺寸标注系统的TOF传感器子系统45。
典型的TOF传感器子系统45可以包括TOF透镜46,以将视场成像到具有多个光电元件(即,像素)的二维传感器(即,TOF传感器47)上,每一个光电元件都将小部分的反射光束转换成电子信号。从每个像素得到的信号是脉冲串。当将像素的信号(即,脉冲串)与传送的信号(即,脉冲光束的调制信号)作比较时,脉冲之间的相移可以被测量。该相移表示光的传送时间(即,渡越时间)。由TOF传感器子系统45造成的是具有与范围相对应的像素的范围图像。范围图像可以被传送到控制子系统60,在控制子系统60中范围图像由在处理器62上运行的软件使用以计算各种尺寸测量(例如,体积或线性尺寸)。
TOF传感器中的像素可以接收在到达物体上的特定点之前已经沿着不同光路(例如,反射路径)行进的光。反射的(即,多路径)光具有相移(即,在反射的调制信号和传送的调制信号之间的时间差),该相移不同于沿着直接路径行进的光(即,在到达感兴趣的物品之前没有经历反射的光)的相移。当多路径光存在时,每个像素处的不同相移的信号组合并且导致不明确的范围计算。被称为多路径失真的这种现象可能引起尺寸标注中的错误,或者可能甚至致使尺寸测量不可能。图1演示了多路径失真。
如图1中所示,渡越时间尺寸标注系统1(即,TOF尺寸标注器)可以朝着感兴趣的物品2发出光束3。通常,光束3的中心与光轴5对准,光轴5与在感兴趣的物品2和TOF尺寸标注器1之间的直接路径共线。光束3在该横向平面中的大小、形状、位置和强度分布被称为照明图案。照明图案可以是方形、多边形的形状(例如,六角形、八角形、菱形、U形)或者非多边形形状(例如,圆形、椭圆形)。照明图案的形状和中心在感兴趣的物品2上的所有点都由光束3照射的范围内是重要的。然而,当光束3的空间幅度7远大于感兴趣的物品2时,问题就出现。这里,一些光束光线可以在到达感兴趣的物品2之前从其他物体反射。
图1通过跟踪一个这样的光线的路径演示了多路径辐射。这里,传送的光线8从环境11(例如,墙壁)反射。光线沿着反射路径9行进并且到达感兴趣的物品2上的点。然后,该光线沿着直接路径10被反射回到TOF尺寸标注器1。同时,不同的光线沿着直接路径10被传送并且沿着相同路径10被反射回到TOF尺寸标注器1。由于两种光线从同一点到达TOF尺寸标注器1但是行进了不同的距离,所以在范围计算中可能出现错误。图1中的光线跟踪路径8、9和10(即,多路径光线)经历比跟踪在TOF尺寸标注器和感兴趣的物品之间的往复直接路径10的光线更长的渡越时间。结果,可能计算针对同一点的两个范围。该模糊性是多路径失真,并且导致尺寸标注的错误。
在一定程度上,可以通过限制感兴趣的物品2的尺寸/形状或通过控制反射环境11(例如,减少反射)来实现最小化多路径照明。然而,这些替代方案对于移动尺寸标注应用(例如,测量在运送之前的包裹的体积)都不是实际的。在移动应用中,环境变化并且通常是不可控制的。此外,包裹的大小/形状可以是非常不同的。更重要的是,在移动应用中的尺寸标注应当是快速和准确的。为了使TOF尺寸标注系统是快速和准确的并且仍然是适合的移动尺寸标注应用,必须测量和控制多路径干扰。得到的系统必须是相对简单的,以便不会破坏前述与TOF尺寸标注系统相关联的简单性。在本公开中体现了用于减轻在渡越时间尺寸标注系统中的多路径干扰的负面影响的系统和方法。减轻是从基于在渡越时间尺寸标注之前对环境的分析来限制照明的空间幅度造成的。
图2图解地描绘了不具有多路径照明的渡越时间尺寸标注系统。与图1的实施例相比,该实施例不具有从背景环境11的反射。多路径反射的缺乏起因于光束3的空间幅度7被限制为包含感兴趣的物品2并且不包括背景环境11。从TOF尺寸标注系统投射并且遵循直接路径10的光线沿着相同的路径反射回到TOF尺寸标注系统。不存在来自感兴趣的物品2上的该点并且沿着该路径反射回到TOF尺寸标注系统的其他光线。结果,多路径失真被消除。因此,消除多路径干扰的方法必须限制照明的空间幅度,所以其照射感兴趣的物品而没有首先被反射。因为许多不同的感兴趣的物品可以被标注尺寸,所以不论感兴趣的物品的大小、形状和位置如何,这样的方法必须适应大范围的感兴趣的物品。
渡越时间尺寸标注系统包括照明子系统。该子系统使用光源20和关联的驱动电路来生成光束3。光源20可以是激光二极管或发光二极管(即,LED),并且可以以光谱的紫外、可见或红外区域内的波长进行辐射。光源20可以通过位于光源20前方的光学子组件25而被滤波、偏振、校准或聚焦以接收其辐射。该光学组件25可以包括光学滤波器、偏光器、透镜或其他部件,以形成光并且将光成形成沿着光轴5朝着感兴趣的物品2投射的光束。为了限制光束3的空间幅度7,可调整孔径30沿着光轴被定位在光学子组件和感兴趣的物品之间。可调整孔径30在阻挡区域中阻挡光的一部分。可调整孔径的阻挡区域的大小、形状和位置被控制,所以照明基本上40照射感兴趣的物品2并且不照射其他物体(例如,位于感兴趣的物品附近的其他物品)或背景环境11(例如,墙壁)。
可调整孔径30可以以若干方式体现。诸如液晶显示器(LCD)设备的电寻址空间光调制器(EASLM)可以被用作TOF尺寸标注系统的照明子系统的可调整孔径30。LCD设备可以采取大量各种形式中的任何一种。LCD设备可以包括电控制的液晶单元的2维阵列、输出偏振滤波器和前面板(例如,玻璃)。来自光源20的光束3可以根据哪个光源被使用来进行偏振。如果使用激光器,则输入偏振滤波器可能或可能不是必要的,然而如果使用非偏振光的光源(例如,LED),则LCD设备应当包括输入偏振滤波器。LCD设备在光束通过液晶单元时使用偏振滤波器和光束的偏振的旋转以控制光束的照明图案。以该方式,各种阻挡区域可以被配置,或者换言之,孔径的大小、形状和/或位置可以被调整。
可调整孔径30的另一可能实施例使用硅基液晶(即,LCoS)设备来在横向于光轴5的平面中控制(即,通过或阻挡)光束。LCoS设备类似LCD显示器,因为LCoS设备依赖于由电子控制的液晶单元的阵列所提供的偏振控制。与控制光束的透射的LCD不同,LCoS设备控制从涂覆有液晶层的反射背板的光的反射。
用于可调整孔径30的另一可能实施例使用数字微镜设备(DMD)来在横向于光轴5的平面中控制光束30。DMD设备使用微镜阵列来选择性地反射部分光束。微镜阵列可以包括例如十万个铝微镜,每个具有大约16μm的直径。每个微镜可以机械地定位在打开或关闭状态。在打开状态中,例如,光以使得光到达感兴趣的物品的方式被反射。然而,在关闭状态中,光以使得光不到达感兴趣的物品的方式被反射。以该方式,DMD设备可以产生二维照明图案。
图3a图解地描绘了用于光学尺寸标注系统的示例性照明子系统。该子系统包括沿着光轴5定位并且位于光轴5中心的部件。该子系统包括生成用于测量渡越时间的脉冲光的光源20(例如,激光器)。该光由位于光源前方的光学子组件25(例如,衍射光学元件)形成并且成形成光束3(例如,校准光)。然后,光束通过可调整孔径30(例如,LCD显示设备)修改,该可调整孔径30控制光束的大小、形状和位置(相对于光轴)(即,照明图案)。在图3a中,不调整光束的空间幅度,并且因此,光到达感兴趣的物品2和背景11。与图3a相比,图3b图示了照明子系统的可调整孔径30,该可调整孔径30配置为控制光束3,所以光束3仅照明对象2。
为了控制可调整孔径,必须存在某个目标大小、形状和位置。这里,目标是:配置可调整孔径,所以感兴趣的物品被专门照射。换言之,在配置可调整孔径之前并且在执行TOF尺寸标注之前,必须首先获得感兴趣的物品的大小、形状和位置。没有该信息,无法适当地调整可调整孔径。
先前方法尝试通过感测在原始TOF传感器数据中的错误,并且然后调整照明以最小化这些错误来执行照明调整。该方法的细节在2014年1月2日的“Time of Flight Measurement Error Reduction Method and Apparatus”(US 20140002828 A1)中被公布,其全部内容通过引用合并于此。本发明使用一种不同的方法。这里,通过被定位和配置用于捕获感兴趣的物品的图像的成像器来检测感兴趣的物品的大小、形状和位置。然后,几何细节使用在处理器(例如,数字信号处理器(DSP))上运行的机器视觉算法来得到,并且被提供给控制子系统60以配置可调整孔径30的透明和不透明(即,阻挡)区域。
成像器50通常是数字相机系统,该数字相机系统可以包括透镜和光电传感器。通常使用成像透镜52,但是这可以是可以创建视场的实际图像的任何光学元件(例如,镜)。光电传感器(即,图像传感器53)通常包括布置为二维像素阵列的多个光电传感器。像素(和关联电路)将视场的实际图像转换成电子信号。图像传感器53可以使用电荷耦合设备(即,CCD)、互补金属氧化物半导体(即,CMOS)传感器或另一感测技术以适合应用。例如,可以针对光谱的紫外(UV)、可见(VIS)或红外(IR)区域中的敏感度来选择传感器材料,并且所产生的图像可以是灰度或彩色的。
在一些实施例中,成像器50可以是较大系统的部分。例如,成像器50可以是标记读取系统(例如,手持式条形码读取器)的一部分,并且以该方式,可以提供用于标记读取的图像,并且促进在TOF尺寸标注系统中的照明控制。
图4示意性描绘了示例性渡越时间尺寸标注系统1的框图1。尺寸标注系统1包括成像器50。成像器50被定位并且配置为捕获感兴趣的物品2的图像。成像器50包括成像透镜52,用于将视场(包括感兴趣的物品)的实际图像形成到图像传感器53上。图像传感器53被配置为将实际图像转换成被传送到成像器数字信号处理器54(即,DSP)电子信号,该成像器数字信号处理器54创建感兴趣的物品及其背景环境的数字图像。在一些可能的实施例中,成像器DSP执行图像处理用于修改捕获图像以促进感兴趣的物品的大小、形状和/或位置的计算。
控制子系统60经由互连系统(例如,总线)90通信地耦合到成像器,互连系统(例如,总线)90互连所有TOF尺寸标注系统的子系统。控制子系统60包括一个或多个处理器62(例如,一个或多个控制器、数字信号处理器(DSP)、专用集成电路(ASIC)、可编程门阵列(PGA)和/或可编程逻辑控制器(PLC)),以从所捕获的图像确定与感兴趣的物品的大小、形状和位置相对应的照明区域。处理器62通常由存储在计算机可读存储器(例如,只读存储器(ROM)、闪速存储器、随机存取存储器(RAM)和/或硬盘驱动)中的软件程序来配置,以识别物品的边缘(例如,边缘检测)。从该边缘信息,照明所需要的区(即,照明区域)可以由处理器62计算并且被存储在存储器64中。然后,处理器可以经由总线90将与照明区域相对应的信号传送到照明子系统40。
照明子系统40生成光束并且使光束成形以用于TOF尺寸标注。通过光源20(例如,激光二极管或LED)来生成光束。光学组件25使用光学元件(例如,透镜或DOE)来聚焦光束。使用可调整孔径30(例如,LCD、LCoS或DMD)来调整光束的空间幅度以匹配与感兴趣的物品相对应的照明区域。
TOF传感器子系统45被定位和配置用于使用TOF透镜46来捕获和聚焦反射的光。TOF传感器47将所收集的光转换成电子信号。然后,该电子信号由TOF数字信号处理器48(例如,DSP)来处理以产生范围图像。范围图像传递在感兴趣的物品上的各种点处的在TOF传感器45和感兴趣的物品2之间的范围(例如,经由灰度值)。经由总线91从TOF传感器子系统向处理器62传送范围图像。处理器被配置为从该范围图像确定感兴趣的物品的(至少)近似尺寸测量。
TOF尺寸标注系统还可以包括用户界面70,用于向用户提供尺寸测量(例如,线性尺寸或体积)结果。在一些实施例中,用户界面70还可以通过提供用于允许用户输入(例如,选择感兴趣的物品)的界面来促进对感兴趣的物品的识别。
TOF尺寸标注系统还可以包括通信子系统80,用于传送和接收来自单独计算设备或存储设备的信息。该通信子系统可以是有线或无线的,并且可以能够实现用各种协议(例如,IEEE 802.11,包括WI-FI®、蓝牙®、CDMA、TDMA或GSM)的通信。
照明子系统40、TOF传感器子系统45、成像器50、控制子系统60、用户界面70和通信子系统80经由耦合器(例如,电线或光纤)、总线和控制线电连接,以形成互连系统90。互连系统90可以包括电源总线或线路、数据总线、指令总线、地址总线等,这允许子系统的操作及其之间的交互。
图5示意性描绘了用于图示渡越时间尺寸标注100的示例性方法的流程图。所图示的方法包括用于减少多路径失真110的步骤。首先,用于尺寸标注的感兴趣的物品102被放置在TOF尺寸标注系统的视场中。然后,感兴趣的物品的图像被捕获103。从该图像,照明区域可以被确定104。这里,用户输入105还可以促进该确定。照明区域对应于(例如,匹配)感兴趣的物品的物理边缘。可调整孔径被调整106,所以光束基本上照射照明区域而没有首先被反射。从感兴趣的物品反射回到TOF尺寸标注系统的光用于执行TOF尺寸标注步骤107。从该步骤,尺寸测量(如,体积)被获得108。
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美国专利号7,726,575;美国专利号8,294,969;
美国专利号8,317,105;美国专利号8,322,622;
美国专利号8,366,005;美国专利号8,371,507;
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美国专利号8,390,909;美国专利号8,408,464;
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美国专利号8,424,768;美国专利号8,448,863;
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美国专利号8,469,272;美国专利号8,474,712;
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美国专利号8,517,271;美国专利号8,523,076;
美国专利号8,528,818;美国专利号8,544,737;
美国专利号8,548,242;美国专利号8,548,420;
美国专利号8,550,335;美国专利号8,550,354;
美国专利号8,550,357;美国专利号8,556,174;
美国专利号8,556,176;美国专利号8,556,177;
美国专利号8,559,767;美国专利号8,599,957;
美国专利号8,561,895;美国专利号8,561,903;
美国专利号8,561,905;美国专利号8,565,107;
美国专利号8,571,307;美国专利号8,579,200;
美国专利号8,583,924;美国专利号8,584,945;
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2012年2月7日(Feng等人)提交的Laser Scanning Module Employing An Elastomeric U-Hinge Based Laser Scanning Assembly的美国专利申请号13/367,978;
2012年11月5日(Fitch等人)提交的Electronic Device的美国专利申请号29/436,337;
2013年2月20日(Anderson)提交的Optical Redirection Adapter的美国专利申请号13/771,508;
2013年3月28日(Barker等人)提交的System and Method for Capturing and Preserving Vehicle Event Data的美国专利申请号13/852,097;
2013年5月24日(Hollifield)提交的System and Method for Display of Information Using a Vehicle-Mount Computer的美国专利申请号13/902,110;
2013年5月24日(Chamberlin)提交的System and Method for Display of Information Using a Vehicle-Mount Computer的美国专利申请号13/902,144;
2013年5月24日(Smith等人)提交的System For Providing A Continuous Communication Link With A Symbol Reading Device的美国专利申请号13/902,242;
2013年6月7日(Jovanovski等人)提交的Method of Error Correction for 3D Imaging Device的美国专利申请号13/912,262;
2013年6月7日(Xian等人)提交的System and Method for Reading Code Symbols at Long Range Using Source Power Control的美国专利申请号13/912,702;
2013年6月19日(Fitch等人)提交的Electronic Device的美国专利申请号29/458,405;
2013年6月20日(Xian等人)提交的System and Method for Reading Code Symbols Using a Variable Field of View的美国专利申请号13/922,339;
2013年6月26日(Todeschini)提交的Code Symbol Reading System Having Adaptive Autofocus的美国专利申请号13/927,398;
2013年6月28日(Gelay等人)提交的Mobile Device Having an Improved User Interface for Reading Code Symbols的美国专利申请号13/930,913;
2013年7月2日(London等人)提交的Electronic Device Enclosure的美国专利申请号29/459,620;
2013年7月2日(Chaney等人)提交的Electronic Device Enclosure的美国专利申请号29/459,681;
2013年7月2日(London等人)提交的Electronic Device Case的美国专利申请号13/933,415;
2013年7月3日(Fitch等人)提交的Scanner and Charging Base的美国专利申请号29/459,785;
2013年7月3日(Zhou等人)提交的Scanner的美国专利申请号29/459,823;
2013年7月22日(Rueblinger等人)提交的System and Method for Selectively Reading Code Symbols的美国专利申请号13/947,296;
2013年7月25日(Jiang)提交的Code Symbol Reading System Having Adjustable Object Detection的美国专利申请号13/950,544;
2013年8月7日(Saber等人)提交的Method for Manufacturing Laser Scanners的美国专利申请号13/961,408;
2013年9月5日(Feng等人)提交的Method for Operating a Laser Scanner的美国专利申请号14/018,729;
2013年9月6日(Todeschini)提交的Device Having Light Source to Reduce Surface Pathogens的美国专利申请号14/019,616;
2013年9月11日(Gannon)提交的Handheld Indicia Reader Having Locking Endcap的美国专利申请号14/023,762;
2013年9月24日(Todeschini)提交的Augmented-Reality Signature Capture的美国专利申请号14/035,474;
2013年9月26日(Oberpriller等人)提交的Electronic Device Case的美国专利申请号29/468,118;
2013年10月16日(Fletcher)提交的Dimensioning System的美国专利申请号14/055,234;
2013年10月14日(Huck)提交的Indicia Reader的美国专利申请号14/053,314;
2013年10月29日(Meier等人)提交的Hybrid System and Method for Reading Indicia的美国专利申请号14/065,768;
2013年11月8日(Hejl等人)提交的Self-Checkout Shopping System的美国专利申请号14/074,746;
2013年11月8日(Smith等人)提交的Method and System for Configuring Mobile Devices via NFC Technology的美国专利申请号14/074,787;
2013年11月22日(Hejl)提交的Optimal Range Indicators for Bar Code Validation的美国专利申请号14/087,190;
2013年12月2日(Peake等人)提交的Method and System for Communicating Information in an Digital Signal的美国专利申请号14/094,087;
2013年12月10日(Xian)提交的High Dynamic-Range Indicia Reading System的美国专利申请号14/101,965;
2014年1月8日(Colavito等人)提交的Incicia-reader Having Unitary Construction Scanner的美国专利申请号14/150,393;
2014年1月14日(Hou等人)提交的Laser Barcode Scanner美国专利申请号14/154,207;
2014年1月28日(Li等人)提交的System and Method for Measuring Irregular Objects with a Single Camera的美国专利申请号14/165,980;
2014年1月28日(Lu等人)提交的Indicia Reading Terminal Including Optical Filter的美国专利申请号14/166,103;
2014年3月7日(Feng等人)提交的Indicia Reader for Size-Limited Applications的美国专利申请号14/200,405;
2014年4月1日(Van Horn等人)提交的Hand-Mounted Indicia-Reading Device with Finger Motion Triggering filed的美国专利申请号14/231,898;
2014年4月11日(Deng等人)提交的Reading Apparatus Having Partial Frame Operating Mode的美国专利申请号14/250,923;
2014年4月21日(Barber等人)提交的Imaging Terminal Having Data Compression的美国专利申请号14/257,174;
2014年4月21日(Showering)提交的Docking System and Method Using Near Field Communication的美国专利申请号14/257,364;
2014年4月29日(Ackley等人)提交的Autofocus Lens System for Indicia Readers的美国专利申请号14/264,173;
2014年5月12日(Marty等人)提交的Mobile Printer with Optional Battery Accessory的美国专利申请号14/274,858;
2014年5月14日(Jovanovski等人)提交的MULTIPURPOSE OPTICAL READER的美国专利申请号14/277,337;
2014年5月21日(Liu等人)提交的TERMINAL HAVING ILLUMINATION AND FOCUS CONTROL的美国专利申请号14/283,282;
2014年6月10日(Braho等人)提交的METHOD AND SYSTEM FOR CONSIDERING INFORMATION ABOUT AN EXPECTED RESPONSE WHEN PERFORMING SPEECH RECOGNITION的美国专利申请号14/300,276;
2014年6月16日(Xian等人)提交的INDICIA READING SYSTEM EMPLOYING DIGITAL GAIN CONTROL的美国专利申请号14/305,153;
2014年6月20日(Koziol等人)提交的AUTOFOCUSING OPTICAL IMAGING DEVICE的美国专利申请号14/310,226;
2014年7月10日(Oberpriller等人)提交的CUSTOMER FACING IMAGING SYSTEMS AND METHODS FOR OBTAINING IMAGES美国专利申请号14/327,722;
2014年7月10日(Hejl)提交的MOBILE-PHONE ADAPTER FOR ELECTRONIC TRANSACTIONS的美国专利申请号14/327,827;
2014年7月11日(Coyle)提交的CELL PHONE READING MODE USING IMAGE TIMER的美国专利申请号14/329,303;
2014年7月17日(Barten)提交的SYMBOL READING SYSTEM WITH INTEGRATED SCALE BASE的美国专利申请号14/333,588;
2014年7月18日(Hejl)提交的SYSTEM AND METHOD FOR INDICIA VERIFICATION的美国专利申请号14/334,934;
2014年7月21日(Amundsen等人)提交的METHOD OF AND SYSTEM FOR DETECTING OBJECT WEIGHING INTERFERENCES的美国专利申请号14/336,188;
2014年7月24日(Xian等人)提交的LASER SCANNING CODE SYMBOL READING SYSTEM的美国专利申请号14/339,708;
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2014年7月21日(Amundsen等人)提交的METHOD OF AND SYSTEM FOR DETECTING OBJECT WEIGHING INTERFERENCES的美国专利申请号14/336,188;
2014年5月1日(Lu等人)提交的Optical Indicia Reading Terminal with Color Image Sensor的美国专利申请号14/355,613;
2014年7月2日(Chen等人)提交的WEB-BASED SCAN-TASK ENABLED SYSTEM AND METHOD OF AND APPARATUS FOR DEVELOPING AND DEPLOYING THE SAME ON A CLIENT-SERVER NETWORK的美国专利申请号14/370,237;
2014年7月2日(Ma等人)提交的INDUSTRIAL DESIGN FOR CONSUMER DEVICE BASED SCANNING AND MOBILITY的美国专利申请号14/370,267;
2014年8月4日(Lu)提交的ENCODED INFORMATION READING TERMINAL INCLUDING HTTP SERVER的美国专利申请号14/376,472;
2014年8月15日(Wang等人)提交的METHOD OF USING CAMERA SENSOR INTERFACE TO TRANSFER MULTIPLE CHANNELS OF SCAN DATA USING AN IMAGE FORMAT的美国专利申请号14/379,057;
2014年8月6日(Todeschini)提交的INTERACTIVE INDICIA READER的美国专利申请号14/452,697;
2014年8月6日(Li等人)提交的DIMENSIONING SYSTEM WITH GUIDED ALIGNMENT美国专利申请号14/453,019;
2014年8月15日(Van Horn等人)提交的APPARATUS FOR DISPLAYING BAR CODES FROM LIGHT EMITTING DISPLAY SURFACES的美国专利申请号14/460,387;
2014年8月15日(Wang等人)提交的ENCODED INFORMATION READING TERMINAL WITH WIRELESS PATH SELECTON CAPABILITY的美国专利申请号14/460,829;
2014年8月19日(Todeschini等人)提交的MOBILE COMPUTING DEVICE WITH DATA COGNITION SOFTWARE的美国专利申请号14/462,801;
2014年7月30日(Wang等人)提交的INDICIA READING TERMINAL PROCESSING PLURALITY OF FRAMES OF IMAGE DATA RESPONSIVELY TO TRIGGER SIGNAL ACTIVATION的美国专利申请号14/446,387;
2014年7月30日(Good等人)提交的MULTIFUNCTION POINT OF SALE APPARATUS WITH OPTICAL SIGNATURE CAPTURE的美国专利申请号14/446,391;
2014年4月2日(Oberpriller等人)提交的Imaging Terminal的美国专利申请号29/486,759;
2014年6月4日(Zhou等人)提交的INDICIA SCANNER的美国专利申请号29/492,903;以及
2014年6月24日(Oberpriller等人)提交的IN-COUNTER BARCODE SCANNER的美国专利申请号29/494,725。
在说明书和/或附图中,已经公开了本发明的典型实施例。本发明不限于这样的示例性实施例。使用术语“和/或”包括相关列出的物品中的一个或多个的任何或全部组合。附图是示意性表示,并且因此没有必要按比例绘制。除非另有说明,否则特定术语已经在一般和描述性意义上使用并且不用于限制的目的。

Claims (15)

1.一种渡越时间(TOF)尺寸标注系统,包括:
照明子系统,被配置为生成并且沿着光轴朝着感兴趣的物品投射光束,所述光束在横向于光轴的平面中的空间幅度被可调整孔径调整以匹配与感兴趣的物品相对应的照明区域;
成像器,被定位和配置用于捕获所述感兴趣的物品的图像并且检测感兴趣的物品的大小、形状和位置;
TOF传感器子系统,被定位和配置用于从所述感兴趣的物品反射的光束捕获范围图像;以及
控制子系统,通信地耦合到所述可调整孔径、所述成像器和所述TOF传感器,所述控制子系统被配置为从所述范围图像确定所述感兴趣的物品的至少近似尺寸测量,
用于显示尺寸测量结果的用户接口子系统;以及
通信子系统,用于传送和接收来自单独计算设备或存储设备的信息;
其中所述照明子系统、所述成像器、所述TOF传感器子系统、所述控制子系统和所述通信子系统通过互连系统进行互连。
2.根据权利要求1所述的渡越时间(TOF)尺寸标注系统,其中,所述光束(i)基本上照射照明区域并且(ii)基本上到达所述感兴趣的物品而没有首先被反射。
3.根据权利要求1所述的渡越时间(TOF)尺寸标注系统,其中,所述TOF尺寸标注系统是手持式的。
4.根据权利要求1所述的渡越时间(TOF)尺寸标注系统,其中,所述照明子系统包括衍射光学元件(DOE)。
5.根据权利要求1所述的渡越时间(TOF)尺寸标注系统,其中,所述可调整孔径包括电寻址空间光调制器(EASLM)。
6.根据权利要求1所述的渡越时间(TOF)尺寸标注系统,其中,所述尺寸测量是体积。
7.一种渡越时间(TOF)尺寸标注系统,包括:
用于生成光的光源;
光学子组件,位于所述光源前方并且被配置为沿着光轴朝着感兴趣的物品投射光束;
可调整孔径,沿着光轴被定位在光学子组件和感兴趣的物品之间,所述可调整孔径包括用于阻挡所述光束的至少一部分的阻挡区域,所述阻挡区域具有可控制的大小、形状和位置。
成像器,被定位和配置用于捕获所述感兴趣的物品的图像并且检测感兴趣的物品的大小、形状和位置;以及
控制子系统,通信地耦合到所述可调整孔径和所述成像器,所述控制子系统被配置为控制所述可调整孔径的阻挡区域,使得来自所述光源的光基本上照射与感兴趣的物品的大小、形状和位置相对应的照明区域并且基本上到达所述感兴趣的物品而没有首先被反射。
8.根据权利要求7所述的渡越时间(TOF)尺寸标注系统,其中,所述光源包括激光器。
9.根据权利要求7所述的渡越时间(TOF)尺寸标注系统,其中,所述光源包括发光二极管(LED)。
10.根据权利要求7所述的渡越时间(TOF)尺寸标注系统,其中,所述光学子组件包括透镜。
11.根据权利要求7所述的渡越时间(TOF)尺寸标注系统,其中,所述光学子组件包括衍射光学元件(DOE)。
12.根据权利要求7所述的渡越时间(TOF)尺寸标注系统,其中,所述可调整孔径包括液晶显示器(LCD)屏幕。
13.根据权利要求7所述的渡越时间(TOF)尺寸标注系统,其中,所述可调整孔径包括硅基液晶(LCoS)投影仪。
14.根据权利要求7所述的渡越时间(TOF)尺寸标注系统,其中,所述可调整孔径包括数字微镜设备(DMD)。
15.根据权利要求7所述的渡越时间(TOF)尺寸标注系统,其中,所述成像器包括电荷耦合设备(CCD)图像传感器和透镜。
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